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SHE-100-A-6.7-G

Manufacturer

IDI

data-sheet
Data sheet
Data sheet
SHE-100-A-6.7-G is utilized in industrial and telecommunications applications, particularly for high current testing on bare and loaded printed circuit boards. Its design ensures reliable connections and accurate measurements in demanding environments, making it ideal for engineers and technicians in testing and development.
Detailed specification
Detailed specification
Contact Probes HEADED CUP PROBE 101274-005-922
Contact Probes HEADED CUP PROBE 101274-005-922
Description
Description
The SHE-100-A-6.7-G is a high current spring probe designed for board testing applications. It features a 0.100" (2.54 mm) center spacing and is rated for up to 8 amps. The probe utilizes a bias spring for effective performance, ensuring low and consistent resistance. Its robust construction includes a gold-plated beryllium copper plunger and a stainless steel barrel, making it suitable for various testing environments.
The SHE-100-A-6.7-G is a high current spring probe designed for board testing applications. It features a 0.100" (2.54 mm) center spacing and is rated for up to 8 amps. The probe utilizes a bias spring for effective performance, ensuring low and consistent resistance. Its robust construction includes a gold-plated beryllium copper plunger and a stainless steel barrel, making it suitable for various testing environments.
Availability
Availability
Can be ordered from Westcomp
Can be ordered from Westcomp
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